Optical scanning and measurement
US9188775B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 2, 2013 |
| Grant date | Nov 17, 2015 |
| Priority date | — |
| Expiry date | Dec 2, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/0181
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus and methods for optical scanning, including an optical probe capable of motion for optical scanning with respect to both the interior and the exterior of a scanned object, the optical probe also including light conducting apparatus disposed so as to conduct scan illumination from a source of scan illumination through the probe; light reflecting apparatus disposed so as to project scan illumination radially away from a longitudinal axis of the probe with at least some of the scan illumination projected onto the scanned object; optical line forming apparatus disposed so as to project scan illumination as a line of scan illumination with at least some of the scan illumination projected onto the scanned object; and a lens disposed so as to conduct, through the probe to an optical sensor, scan illumination reflected from the scanned object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.