Method and device for temperature-based data refresh in non-volatile memories
US9190165B2 · kind B2 · utility
0Cited by
11References
20Claims
0Family size
Assignee
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Key dates
| Filing date | Feb 9, 2015 |
| Grant date | Nov 17, 2015 |
| Priority date | — |
| Expiry date | Feb 9, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C16/349
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The invention relates to a method comprising measuring the temperature of at least one location of a non-volatile memory; determining if said temperature measurement indicates that the data retention time of data stored at said at least one location is reduced below a threshold; and re-writing said data to said non-volatile memory in a response to a positive determination.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.