Patent · US Active

Method and device for the detection of surface defects of a component

US9194810B2 · kind B2 · utility

3Cited by

4References

20Claims

0Family size

Assignee

STEINBICHLER OPTOTECHNIK GMBH · DE

Inventors

Christian Schleith · Neubeuern, DE
Horst Winterberg · Bad Feilnbach, DE
Marcus Steinbichler · Neubeuern, DE

Key dates

Filing date	Aug 8, 2008
Grant date	Nov 24, 2015
Priority date	—
Expiry date	Aug 7, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG01N21/8806
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method serves the detection of surface defects of a component. The surface of the component (5) is radiated from the side with light from a light source (4, 4′). The light radiated back from the surface of the component (5) is detected by a sensor. To improve such a method, only a rear region (19, 19′) of the surface of the component (5) is radiated with light from the light source (4, 4′) and/or only the light radiated back from a rear region (19, 19′) of the surface of the component (5) is detected by the sensor and/or evaluated by an evaluation device FIG. 3).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.