Integrated circuit with analog device fault detection
US9194884B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 28, 2012 |
| Grant date | Nov 24, 2015 |
| Priority date | — |
| Expiry date | Aug 28, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit with analog device fault detection includes an integrated circuit die having an analog device, an on-line fault detector and a control circuit. The analog device has a power input, an analog device input and an analog device output and the on-line fault detector is coupled to at least one of the power input, the analog device input and the analog device output and has a fault detector output. The control circuit is coupled to the fault detector and responsive to the fault detector output. Detector self-test (DST) circuitry can be provided to test the on-line fault detector and one or more circuit breakers can be provided to protect the analog device and other devices attached to the analog device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.