Patent · US Active

Defect analysis system for error impact reduction

US9195566B2 · kind B2 · utility

7Cited by
5References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 14, 2013
Grant dateNov 24, 2015
Priority date
Expiry dateOct 14, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/366
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An apparatus includes a network interface, memory, and a processor. The processor is coupled with the network interface and memory. The processor is configured to analyze a first set of data associated with a plurality of data sources. Analyzing the first set of data associated with the plurality of data sources determines a plurality of relationships among the first set of data. The processor is configured to store indications of the plurality of relationships among the first set of data. An indication of a relationship indicates a possible software defect. The processor is configured to generate rules based, at least in part, on the first set of data associated with a plurality of data sources. A rule indicates a possible software defect.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.