Scalable prediction failure analysis for memory used in modern computers
US9196383B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 27, 2013 |
| Grant date | Nov 24, 2015 |
| Priority date | — |
| Expiry date | Feb 6, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/0409
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
One embodiment provides a method for scalable predictive failure analysis. Embodiments of the method may include gathering memory information for memory on a user computer system having at least one processor. Further, the method includes selecting one or more memory-related parameters. Further still, the method includes calculating based on the gathering and the selecting, a single bit error value for the scalable predictive failure analysis through calculations for each of the one or more memory-related parameters that utilize the memory information. Yet further, the method includes setting, based on the calculating, the single bit error value for the user computer system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.