Automated defect identification and resolution
US9202167B1 · kind B1 · utility
3Cited by
3References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 27, 2013 |
| Grant date | Dec 1, 2015 |
| Priority date | — |
| Expiry date | Feb 26, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method, article of manufacture, and apparatus for identifying and resolving defects in multiple clusters based on a reported defect instance is discussed. Computer systems may be grouped into clusters. A report of a defective system may be received, and the defective system's cluster may be identified. A defect solution may then be distributed to all the systems in that cluster.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.