Disk drive calibrating defect threshold based on statistical quality metric measured for reference tracks
US9202517B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 8, 2013 |
| Grant date | Dec 1, 2015 |
| Priority date | — |
| Expiry date | Feb 8, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B20/10305
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A disk drive is disclosed comprising a head actuated over a disk comprising a plurality of data tracks. First data is written to a first data track, and the first data is read from the first data track to measure a first quality metric representing a recording quality of the first data. Second data is written to a second data track, and the second data is read from the second data track to measure a second quality metric representing a recording quality of the second data. The first and second quality metrics are processed to generate a first statistical quality metric. A first defect threshold is generated based on the first statistical quality metric, and at least part of the disk is scanned for defects based on the first defect threshold.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.