Apparatus, system and method for scanning monochromator and diode array spectrometer instrumentation
US9207118B2 · kind B2 · utility
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17Claims
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Key dates
| Filing date | Mar 23, 2012 |
| Grant date | Dec 8, 2015 |
| Priority date | — |
| Expiry date | Apr 21, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for determining bias in a spectrometer is described. One embodiment includes a method for determining bias in a spectrometer system, the method comprising over-scanning a grating in a near-zero-response wavelength range; and determining a bias based on the over-scanning. This methodology allows for over-scanning a grating in a near-zero-response wavelength range as a substitute for using shutters or other mechanisms to block light from entering a detector in the system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.