Patent · US Active

System and method for null-lens wavefront sensing

US9207145B1 · kind B1 · utility

0Cited by

1References

11Claims

0Family size

Assignee

The United States of America as represented by the Administrator of the National Aeronautics and Space Administration · US

Inventors

Peter C. Hill · Plano, US
Patrick THOMPSON · Laurel, US
David L. Aronstein · Silver Spring, US
Matthew R. Bolcar · Laurel, US
Jeffrey S. Smith · Overland Park, US

Key dates

Filing date	Feb 21, 2014
Grant date	Dec 8, 2015
Priority date	—
Expiry date	Apr 6, 2034

Classification

Technology area (CPC G)Physics
CPC primaryG01M11/0257
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method of measuring aberrations in a null-lens including assembly and alignment aberrations. The null-lens may be used for measuring aberrations in an aspheric optic with the null-lens. Light propagates from the aspheric optic location through the null-lens, while sweeping a detector through the null-lens focal plane. Image data being is collected at locations about said focal plane. Light is simulated propagating to the collection locations for each collected image. Null-lens aberrations may extracted, e.g., applying image-based wavefront-sensing to collected images and simulation results. The null-lens aberrations improve accuracy in measuring aspheric optic aberrations.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.