Method and system for creep measurement
US9207154B2 · kind B2 · utility
20Cited by
26References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 22, 2013 |
| Grant date | Dec 8, 2015 |
| Priority date | — |
| Expiry date | Feb 8, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2203/0647
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system for monitoring creep in an object are provided. The creep monitoring system includes a creep sensor assembly that includes at least one image pattern pair disposed on a surface of the object. The creep monitoring method includes receiving information from the creep sensor assembly regarding an observed creep and an offset associated with the object, correcting the observed creep using the information regarding the offset and outputting the corrected information relative to the creep.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.