Determining lens alignment on an eye using optical wavefronts
US9207466B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 26, 2013 |
| Grant date | Dec 8, 2015 |
| Priority date | — |
| Expiry date | Dec 11, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02C2200/22
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
An apparatus and method for selecting a lens that accounts for Decentration and/or Rotation Errors. The method includes obtaining results of a first wavefront exam on a patient, including a wavefront map and Zernike polynomials, selecting a first lens that improves vision, obtaining the results of a second wavefront exam including a wavefront map and Zernike polynomials, calculating the Decentration and/or Rotation Errors of the selected lens by calculating a difference between the Zernike polynomails, and selecting a second lens that better corrects accounts for the calculated Decentration and/or Rotation Errors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.