Impedance measurement system, impedance measurement method and program
US9213051B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 12, 2012 |
| Grant date | Dec 15, 2015 |
| Priority date | — |
| Expiry date | Jun 4, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/40
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A condition input device inputs a measurement condition and the information of an electronic apparatus to be measured. A measurement operation program device selects a program that causes the electronic apparatus to perform an measurement operation based on the information of a measuring target object and the measurement condition. A voltage measurement device measures a voltage variation generated by the power source of the electronic apparatus. A wave form calculating device performs an arithmetic processing, such as a filtering processing or a time-frequency conversion (e.g. Fourier conversion) for the measured voltage variation to obtain the frequency characteristics of the voltage variation. An impedance calculating device calculates an impedance from the frequency characteristics of the voltage variation and the frequency characteristics of current and the condition of the measurement operation program.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.