Patent · US Active

Using test elements of an integrated circuit for integrated circuit testing

US9213059B2 · kind B2 · utility

0Cited by
3References
17Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 4, 2013
Grant dateDec 15, 2015
Priority date—
Expiry dateSep 4, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2879
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In some examples, a system, such as an integrated circuit device (IC), includes functional elements interspersed with access elements and associated test elements. The access elements and associated test elements may be used to determine a health status of the IC or an area of the IC. A health status determination can include, for example, identification of an area of the IC where performance may have degraded (e.g., has degraded or is about to degrade beyond desirable levels of performance). For example, a test element can be configured to generate a parametric output in response to an electrical stimulus, where the parametric output indicates a health status of one or more functional elements of the IC.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.