Method and apparatus for improved sampling resolution in X-ray imaging systems

US9217719B2 · kind B2 · utility

Assignee

• NOVARAY MEDICAL, INC. · US

Inventors

• Augustus Percival Lowell · Durham, US
• Tobias Funk · Martinez, US
• Chwen-yuan Ku · San Jose, US
• Josh Star-Lack · Palo Alto, US
• Edward G. Solomon · Menlo Park, US
• Winston Sun · San Jose, US

Key dates

• Filing date: Jan 10, 2013
• Grant date: Dec 22, 2015
• Expiry date: Jul 28, 2033

Classification

• Technology area (CPC A): Human Necessities
• CPC primary: A61B6/487
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The present invention pertains to an apparatus and method for X-ray imaging wherein a radiation source comprising rows of discrete emissive locations can be positioned such that these rows are angularly offset relative to rows of sensing elements on a radiation sensor. A processor can process and allocate responses of the sensing elements in appropriate memory locations given the angular offset between source and sensor. This manner of allocation can include allocating the responses into data rows associated with unique positions along a direction of columns of discrete emissive locations on the source. Mapping coefficients can be determined that map allocated responses into an image plane.