Patent · US Active

Method and apparatus for controlling a surface scanning coordinate measuring machine

US9217997B2 · kind B2 · utility

0Cited by
10References
30Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 13, 2011
Grant dateDec 22, 2015
Priority date—
Expiry dateJan 17, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B21/047
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method improves surface scanning measure machine speed while minimizing tip touchdown impact on the surface of the object being measured. Specifically, the method controls a surface scanning measuring machine having a probe head with a distal probe tip that contacts the surface of an object to be measured. To that end, the method selects a nominal initial contact point (on the surface) having a normal vector, and then moves the distal probe tip toward the nominal initial contact point along an approach path. The approach path has a generally linear portion that generally linearly extends from the nominal initial contact point to some non-contacting point spaced from the surface. The generally linear portion forms an angle of between about 20 degrees and about 60 degrees with the normal vector.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.