Evaluating device quality
US9219555B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 8, 2014 |
| Grant date | Dec 22, 2015 |
| Priority date | — |
| Expiry date | Jun 4, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/29
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
Systems and methods for evaluating device quality are disclosed. Some implementations include receiving, operational parameters for a mobile device, where the operational parameters include data related to service disturbances in a plurality of areas of operational performance of the mobile device, computing, for each dimension of a plurality of dimensions, a curve indicative of a relationship between a device quality index (DQI) and operational parameters of the mobile device, where each dimension corresponds to a particular area of operational performance of the mobile device, identifying cliff points in each dimension of a multi-dimensional surface fitted to each computed curve, where each cliff point corresponds to a reduction in a user's quality of experience in a particular area of operational performance, and projecting the identified cliff points in each dimension of the multi-dimensional surface to determine a horizontal space in the multi-dimensional surface corresponding to a region of acceptable DQIs.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.