Measurement system that estimates reflection characteristics of a target object and control method thereof
US9222882B2 · kind B2 · utility
7Cited by
1References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 9, 2014 |
| Grant date | Dec 29, 2015 |
| Priority date | — |
| Expiry date | May 9, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2200/08
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measurement apparatus comprises a light source of line shape configured to move in a predetermined direction and illuminate a measurement target object, and a capturing unit configured to capture the measurement target object illuminated by the light source of line shape. The measurement apparatus controls the light source of line shape and the capturing unit, and estimates the reflection characteristics of the measurement target object from a plurality of images captured by the capturing unit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.