Sample analysis device, testing apparatus, and sensor cartridge
US9222889B2 · kind B2 · utility
1Cited by
11References
8Claims
0Family size
Assignee
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Key dates
| Filing date | May 2, 2013 |
| Grant date | Dec 29, 2015 |
| Priority date | — |
| Expiry date | May 2, 2033 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S977/954
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A sample analysis device capable of realizing the enhancement of a near-field light while increasing a hotspot areal density is provided. In a sample analysis device, multiple nanostructures are arranged on the surface of a base body. A dielectric body is covered with a metal film in each nanostructure. The nanostructures form multiple nanostructure lines. In each nanostructure line, the nanostructures are arranged at a first pitch SP which is smaller than the wavelength of an excitation light and the nanostructure lines are arranged in parallel with one another at a second pitch LP which is greater than the first pitch SP.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.