X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus
US9222900B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 5, 2013 |
| Grant date | Dec 29, 2015 |
| Priority date | — |
| Expiry date | Aug 4, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/649
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray diffraction method of mapping grain structures in a polycrystalline material sample, where an X-ray detector detects substantially line-shaped segments from beams diffracted from at least some of the grains. A processing device analyzes values received from the X-ray detector and identifies at least the position and the length of the line-shaped segments. The line-shaped segments are paired as originating from diffractions from the same grain and the positions of the paired line-shaped segments are used in determining the crystallographic grain position of this grain within in the polycrystalline material sample. The length of the paired line-shaped segments is used in determining a width of this grain.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.