X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus
US9222901B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Mar 5, 2014 |
| Grant date | Dec 29, 2015 |
| Priority date | — |
| Expiry date | Mar 5, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/649
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray diffraction method of mapping grain structures in a polycrystalline material sample, where an X-ray detector detects spots or line-shaped segments from beams diffracted from at least some of the grains. A processing device analyzes values received from the X-ray detector and identifies at least the position of the spots or line-shaped segments. The processing device discretizes an initial three-dimensional model of the polycrystalline material sample into voxels and reconstructs the grains in the model by iterative testing associating crystallographic orientations of the voxels to the detected spots or line-shaped segments.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.