Eddy current flaw detection system and eddy current flaw detection method
US9222915B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 23, 2013 |
| Grant date | Dec 29, 2015 |
| Priority date | — |
| Expiry date | Apr 18, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/902
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An eddy current flaw detection system includes an eddy current flaw detection probe having a substrate facing an inspection surface, and at least one exciting coil and at least two detecting coils provided on the substrate, a scanning device which scans the probe on the inspection surface, a scan control device which drives and controls the scanning device, an eddy current flaw detection device which acquires results of detection of a plurality of detection points corresponding to combinations of the exciting and detecting coils for each scan position of the probe, and a data processing/display device which processes data from the scan control device and the eddy current flaw detection device and thereby displays a result of flaw detection. The data processing/display device acquires three-dimensional coordinates of the detection points for each scan position of the probe and thereby creates three-dimensional flaw detection data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.