Patent · US Active

On-die jitter generator

US9222972B1 · kind B1 · utility

1Cited by

4References

20Claims

0Family size

Assignee

Altera Corporation · US

Inventors

Weiqi Ding · Fremont, US
Sergey Shumarayev · Los Altos Hills, US
Mingde Pan · معلمی نژاد, US
Peng Li · Beijing, CN
Masashi Shimanouchi · San Jose, US

Key dates

Filing date	Sep 17, 2010
Grant date	Dec 29, 2015
Priority date	—
Expiry date	Sep 2, 2034

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/31709
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An IC that includes a jitter generator, where the jitter generator is integral with the IC and generates non-intrinsic jitter, is provided. In one implementation, the non-intrinsic jitter is used to measure a characteristic of the IC. In one implementation, the non-intrinsic jitter is used to test jitter tolerance of the IC. In yet another implementation, the non-intrinsic jitter is used to test another IC coupled to the IC that includes the jitter generator.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.