Compact dark field light source and dark field image analysis at low magnification
US9224031B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 18, 2011 |
| Grant date | Dec 29, 2015 |
| Priority date | — |
| Expiry date | Feb 7, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30024
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to image analysis of dark field images obtained at low magnification below 10:1. Image analysis of dark field images obtained at low magnification can be combined with analyzes of images obtained in respect of the same section of a sample and same magnification but with other techniques such as fluorescent microscopy. The system and method can be used e.g. for particle counting, particle size measurement, particle size distribution, morphology measurement, where the particles can be cells and/or cell parts. The invention also relates to a compact dark field light source unit, a system or apparatus including a microscope which by itself is compact and comprises the mentioned dark field light source unit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.