Apparatus and method for self-testing a component for signal recovery
US9231635B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 19, 2014 |
| Grant date | Jan 5, 2016 |
| Priority date | — |
| Expiry date | Dec 19, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L25/03949
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A circuit having a component for signal recovery, such as an adaptive equalizer, may be tested in order to ensure that the component operates properly. Unfortunately, external test equipment may be expensive and prone to being damaged. According to an aspect of the disclosure, there is provided a circuit including BIST (Built-in Self-Test) circuitry for testing a component for signal recovery with a stress signal that simulates an imperfect signal received over a communication channel. The circuit also has a detector for determining whether the component is operating properly with the stress signal. Thus, no external test equipment is needed for testing the component. In some implementations, the BIST circuitry includes a low-pass filter for filtering a transmit signal into the stress signal. Thus, the amount of circuitry involved in generating the stress signal can be reduced.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.