Optical thread profiler
US9234748B2 · kind B2 · utility
4Cited by
7References
26Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 29, 2014 |
| Grant date | Jan 12, 2016 |
| Priority date | — |
| Expiry date | Aug 29, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus configured to measure at least one physical characteristic of an threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.