Determination of a material characteristic with the use of second-order photon correlation
US9234840B2 · kind B2 · utility
Inventor
Key dates
| Filing date | Mar 22, 2012 |
| Grant date | Jan 12, 2016 |
| Priority date | — |
| Expiry date | Nov 6, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/84
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical system and method for characterizing an object is provided. The system includes at least one light source configured to direct photons toward an object and an interferometer configured to receive photons from the object. The system also includes at least one detector system adapted to detect an optical signal at an output of the interferometer and to remove, from the detected optical signal, a signal portion representing first order photon correlations, when present. The system also includes a processor configured to receive data relating to second-order correlated photons from said at least one detector system, each photon or photon pair subject to at least two indistinguishable paths to a photon or photon pair, but differing in at least one of time and length. The processor is configured to characterize the object based on a self interference of the second-order correlated photons from a common location within the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.