Method and apparatus for monitoring ion lens connections
US9234932B2 · kind B2 · utility
0Cited by
4References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 13, 2013 |
| Grant date | Jan 12, 2016 |
| Priority date | — |
| Expiry date | Feb 1, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/0031
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
This technology is directed to a method and apparatus for monitoring or testing defects associated with an ion lens connected within a mass spectrometer. In some implementations, the testing mechanism monitors a connection of one or more ion lenses configured in the mass spectrometer to determine if voltage is effectively applied to the ion lens. The testing circuit of the present technology includes at least one Zener diode added to the voltage divider and monitoring a change in slope of the applied voltage versus the voltage at the read-back circuit. The change in slope may be easily measured.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.