System and method for linearization of multi-camera flat panel X-ray detectors
US9234967B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 24, 2012 |
| Grant date | Jan 12, 2016 |
| Priority date | — |
| Expiry date | Apr 24, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/30
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
System and method for linearization of photometric response of an imaging sensor of a multi-camera flat panel X-Ray detector. The linearization includes acquiring by the imaging sensor, during a linearization phase, at least two images related to detectable radiation radiated by a scintillator in response to X-Ray radiation generated by an X-Ray source at a field of view of the imaging sensor, wherein the intensity of the X-Ray radiation generated by the X-Ray source is different for each of the images, measuring by a light energy measurement unit, substantially simultaneously with the acquiring of each of the images, at least two corresponding levels of energy of the detectable radiation, wherein the light energy measurement unit is substantially linear at the range of operation, and calculating an inverse response function to the imaging sensor based on the images and on the corresponding levels of energy.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.