Patent · US Active

Testing scheduling system and method

US9235489B2 · kind B2 · utility

3Cited by
2References
8Claims
0Family size

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Key dates

Filing dateMay 30, 2014
Grant dateJan 12, 2016
Priority date
Expiry dateSep 6, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/26
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A testing scheduling system for optimizing and scheduling a testing path among a plurality of available work station calculates a distance between work stations according to the coordinates of the of the available work stations, assigns a value to a quantity, and applies this to the failure rate of each work station, the backlog quantities of each work station, the test-awaited quantities, and the distances between each available work station to acquire a failure rate value, a backlog quantities value, a test-awaited quantities value, and a distances value. The testing scheduling system further calculates a first weighted value of each available work station by summing the failure rate value, the backlog quantities value, the test-awaited quantities value, and the distances value of each available work station, and analyzes the first weighted values to determine a preferred work station.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.