Identifying regions characterized by labeled measurements
US9235890B2 · kind B2 · utility
1Cited by
2References
16Claims
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Key dates
| Filing date | Mar 15, 2013 |
| Grant date | Jan 12, 2016 |
| Priority date | — |
| Expiry date | Aug 5, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30181
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Briefly, the disclosure describes embodiments of methods or apparatuses for processing, such as smoothing, a set of labeled measurements at a variety of scale levels. In one or more non-limiting embodiments purely for illustrative purposes, relatively fine details of labeled measurements may be displayed utilizing a relatively low-scale map, such as a map showing individual towns and/or villages. For display utilizing a relatively higher scale map, such as a map showing larger geopolitical areas, for example, relatively fine details may be omitted.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.