Method for fast test strip intensity recognition
US9240039B2 · kind B2 · utility
6Cited by
1References
15Claims
0Family size
Inventors
Key dates
| Filing date | Jan 30, 2014 |
| Grant date | Jan 19, 2016 |
| Priority date | — |
| Expiry date | Jan 30, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/1748
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Techniques for fast and accurate measuring test strip intensities are disclosed herein. A method for measuring a test strip intensity comprising steps of obtaining an image of a sample line in a test strip and a plurality of reference lines, wherein the reference lines have known intensities; determining grayscale values of the sample line and the reference lines from the image; constructing a standard curve based on the grayscale values versus the known intensities of the reference lines; and determining the intensity of the sample line by fitting the grayscale value of the sample line on the standard curve.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.