Method and device for detecting defects in material distribution in transparent containers
US9244020B2 · kind B2 · utility
6Cited by
21References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 16, 2012 |
| Grant date | Jan 26, 2016 |
| Priority date | — |
| Expiry date | May 24, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/90
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An inspection process for detecting defects of thin type, on transparent containers for a series of inspection points distributed over an inspection region superposed according to a determined height of the container taken according to central axis thereof, and according to the circumference of the container comprising:
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.