Extensible meta model for capturing solution patterns
US9244659B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 26, 2010 |
| Grant date | Jan 26, 2016 |
| Priority date | — |
| Expiry date | Nov 27, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N21/4316
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for capturing patterns and associated points of variability includes providing an XML schema defining elements representing different point of variability (POV) types for a pattern. The elements belong to an XML schema “substitution group” to enable the POV types to be substituted for one another. In selected embodiments, the method enables a pattern author to add new or custom POV types to the “substitution group,” thereby allowing the pattern author to extend the pattern meta model to include new POV types. Once the desired POV types are defined, the method enables the pattern author to generate an instance of the XML schema, defining the points of variability for a specific pattern, using the elements defined in the XML schema “substitution group.” A corresponding apparatus and computer program product are also disclosed and claimed herein.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.