Patent · US Active

Reputation analysis system and reputation analysis method

US9245023B2 · kind B2 · utility

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10Claims
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Key dates

Filing dateNov 15, 2010
Grant dateJan 26, 2016
Priority date
Expiry dateJul 12, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06Q30/02
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Described are a reputation analysis device, reputation analysis method, and reputation analysis-use program capable of suitably analyzing temporal changes in reputation for an object indicated by a keyword. The disclosed reputation analysis device is provided with a voluntary activity description extraction means for extracting descriptions representing voluntary activity related to an object indicated by a keyword that has been input from within a plurality of documents; and a reputation chronological data estimation means for counting the number of occurrences of voluntary activity at each time point wherein the voluntary activity expressed by a description representing the voluntary activity related to the object has been performed, and estimating reputation chronological data for chronologically representing evaluations for the object by the agents of the voluntary activity.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.