Probabilistic method and system for testing a material
US9245067B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 15, 2013 |
| Grant date | Jan 26, 2016 |
| Priority date | — |
| Expiry date | Apr 10, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/20
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method implemented using a processor based device for simulation based testing of materials, includes selecting a first set of points from a data generated from a design space and generating a stochastic metamodel based on the first set of points. The method also includes determining an uncertainty value based on the stochastic metamodel. The method also includes identifying a second set of points different from the first set of points, from the data generated from the design space, based on the uncertainty value. The method further includes combining the second set of points with the first set of points to generate a third set of points, assigning the third set of points to the first set of points. The method also includes iteratively generating, determining, identifying, combining, and assigning steps till the uncertainty value is less than or equal to a predetermined threshold value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.