Patent · US Active

Memory circuit structure and semiconductor process for manufacturing the same

US9245766B2 · kind B2 · utility

4Cited by
0References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 19, 2014
Grant dateJan 26, 2016
Priority date
Expiry dateMay 19, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor process for manufacturing particular patterns includes the steps of forming a target layer and evenly-spaced core bodies on a substrate, conformally forming a hard mask layer, forming a first photoresist covering a predetermined region on the hard mask layer wherein the predetermined region encompasses at least two core bodies, performing a first etch process to remove a portion of the hard mask layer outside the predetermined region and expose a number of core bodies, removing the exposed core bodies, forming a second photoresist at least encompassing all the recesses in the predetermined region, and performing a second etch process to pattern the target layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.