Patent · US Active

Method and system for in-line real-time measurements of layers of multilayered front contacts of photovoltaic devices and calculation of opto-electronic properties and layer thicknesses thereof

US9245808B2 · kind B2 · utility

0Cited by

9References

29Claims

0Family size

Assignee

First Solar, Inc. · US

Inventors

Benyamin Buller · Cupertino, US
Douglas Dauson · Perrysburg, US
David Hwang · Perrysburg, US
Scott Mills · Phoenix, US
Dale Roberts · Temperance, US
Rui Shao · Dublin, US
Zhibo Zhao · Ann Arbor, US

Key dates

Filing date	Dec 19, 2013
Grant date	Jan 26, 2016
Priority date	—
Expiry date	Dec 19, 2033

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY02E10/50
WIPO fieldElectrical machinery, apparatus, energy
WIPO sectorElectrical engineering

Abstract

A method and system for real-time, in-line calculations of opto-electronic properties and thickness of the layers of multi-layered transparent conductive oxide stacks of photovoltaic devices is provided. The method and system include taking measurements of each layer of the stack during deposition thereof. The measurements are then used to calculate the opto-electronic properties and thicknesses of the layers in real-time.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.