Patent · US Active

Apparatus for detecting defect of work

US9247213B2 · kind B2 · utility

4Cited by
6References
3Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 23, 2011
Grant dateJan 26, 2016
Priority date
Expiry dateFeb 2, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/952
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A defect detecting apparatus detects a defect that is present on the outer circumferential surface of work having the outer circumferential surface thereof formed as a bent surface. The defect detecting apparatus is provided with: a jig which supports the work, and holds the work in a state wherein the work is rotated by a predetermined angle; an image pickup device, which picks up an image of the outer circumferential surface of the work held by the jig, the work being in the state wherein the work is rotated by the predetermined angle; and a controller, which processes an image obtained by means of the image pickup device, and determines a defect. The controller stores information relating to the shape of the outer circumferential surface of the work, and information relating to the positional relationship, at each rotation angle, between the image pickup device and a work area having the image thereof picked up by the image pickup device, and the control apparatus uses the information at the time of determining the defect.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.