Systems and methods for detecting light leakage in a device
US9250154B1 · kind B1 · utility
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1References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 26, 2014 |
| Grant date | Feb 2, 2016 |
| Priority date | — |
| Expiry date | Jun 26, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/125
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
According to one or more embodiments of the disclosure, a testing apparatus is provided. The testing apparatus may include a base portion configured to receive a device under test (DUT). The base portion may also include an array of light sensors to measure light leakage from the DUT. For example, the testing apparatus may receive, from the array of light sensors, one or more light intensity measurements associated with light leakage from between a bezel element and a display element along a first edge portion of the DUT. The testing apparatus may then transmit the measurements to a testing computer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.