Method and device for superresolution optical measurement using singular optics
US9250185B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 14, 2011 |
| Grant date | Feb 2, 2016 |
| Priority date | — |
| Expiry date | Apr 30, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/12
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention proposes an optical method of measurement and an optical apparatus for determining the spatial position of at least one luminous nanoemitter of a sample, the method comprising: the projection of a sequence of at least two compact luminous distributions of different topological families onto the sample, the detection of the light reemitted by said at least one luminous nanoemitter of the sample; the generation of at least one optical image for each luminous distribution, on the basis of the light detected; and the algorithmic analysis of the optical images to obtain information regarding the location of said at least one luminous nanoemitter. The invention further relates to an optical method of measurement and an optical apparatus for determining the spatial position of a plurality of point light sources, the method comprising the detection of the light emitted by the plurality of point light sources; and the separation of the light emitted on a plurality of detectors for simultaneous or sequential detections; the proportion of the light emitted by a point light source, channeled to a specific detector, being dependent on the spatial position of said point light sourc…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.