CMM with flaw detection system
US9250214B2 · kind B2 · utility
3Cited by
117References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 12, 2013 |
| Grant date | Feb 2, 2016 |
| Priority date | — |
| Expiry date | Mar 22, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N29/225
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A flaw detection system includes a CMM having a base and one or more transfer members, one or more articulation members connecting the one or more transfer members to the base, and a flaw detection sensor at a distal end, the CMM being configured to measure a location of the flaw detection sensor, and a processor configured to correlate the location of the flaw detection sensor as measured by the CMM with data detected by the flaw detection sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.