Freeform surface reflective scanning system
US9250438B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Nov 12, 2014 |
| Grant date | Feb 2, 2016 |
| Priority date | — |
| Expiry date | Nov 12, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B26/101
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A freeform surface reflective scanning system includes a light source, an aperture, a first freeform surface mirror, and a second freeform surface mirror. The light source is configured to provide a laser. The first freeform surface mirror is located on an aperture side that is away from the light source. The first freeform surface mirror is configured to reflect the laser to form a first reflected light. The second freeform surface mirror is located on a first reflected light path. The second freeform surface mirror is configured to reflect the first reflected light to form a second reflected light. Both the first freeform surface mirror and the second freeform surface mirror are a fourth XY polynomial surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.