Automated metric information network
US9251419B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 7, 2013 |
| Grant date | Feb 2, 2016 |
| Priority date | — |
| Expiry date | Sep 18, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V30/422
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A Metric Information Network (MIN) with a plurality of Ground Control Points (GCPs) that are selected in an automated fashion. The GCP selection includes clustering algorithms as compared to prior art pair-wise matching algorithms. Further, the image processing that takes place in identifying interest points, clustering, and selecting tie points to be GCPs is all performed before the MIN is updated. By arranging for the processing to happen in this manner, the processing that is embarrassingly parallel (identifying interest points, clustering, and selecting tie points) can be performed in a distributed fashion across many computers and then the MIN can be updated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.