Method and system for generating soft-information after a single read in NAND flash using expected and measured values
US9256522B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 8, 2013 |
| Grant date | Feb 9, 2016 |
| Priority date | — |
| Expiry date | Mar 11, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2212/2022
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method for determining soft read data for a group of cells in a nonvolatile flash memory are disclosed. An expected value representative of a plurality of stored values in a group of cells is obtained. A measured value representative of the plurality of stored values in the group of cells is obtained, based on a single read to the group of cells. A soft read data for the group of cells is determined based at least in part on the expected value and the measured value. The expected and measured values may include at least one of a number of 0s, a number of 1s, a ratio of 0s to 1s or a ratio of 1s to 0s. A reliability for a bit i may be obtained using a one-step majority logic decoder, and a threshold reliability may be used when determining the soft read data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.