Patent · US Active

Probe

US9261345B2 · kind B2 · utility

0Cited by

19References

19Claims

0Family size

Assignee

Elcometer Limited · GB

Inventors

Colin John Morley · Manchester, GB
John Michael Whitaker · Manchester, GB
Michael Carrington Sellars · Manchester, GB

Key dates

Filing date	Aug 21, 2013
Grant date	Feb 16, 2016
Priority date	—
Expiry date	Feb 25, 2034

Classification

Technology area (CPC G)Physics
CPC primaryG01B7/34
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A surface profile measurement probe comprising two spaced apart points 20 for contacting a convex surface to be measured and a straight edge or surface 22 moveable relative to the two points to enable the straight edge to be brought into contact with a convex surface contacted by the two points. A tip 10 protrudes from and is moveably mounted relative to the straight edge or surface for measuring the profile of a surface contacted by the straight edge.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.