Prism-coupling systems and methods for characterizing large depth-of-layer waveguides
US9261429B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 8, 2015 |
| Grant date | Feb 16, 2016 |
| Priority date | — |
| Expiry date | May 8, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/4126
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Prism-coupling systems and methods for characterizing large depth-of-layer waveguides are disclosed. The systems and methods utilize a coupling prism having a coupling angle α having a maximum coupling angle αmax at which total internal reflection occurs. The prism angle α is in the range 0.81αmax≦α≦0.99αmax. This configuration causes the more spaced-apart lower-order mode lines to move closer together and the more tightly spaced higher-order mode lines to separate. The adjusted mode-line spacing allows for proper sampling at the detector of the otherwise tightly spaced mode lines. The mode-line spacings of the detected mode spectra are then corrected via post-processing. The corrected mode spectra are then processed to obtain at least one characteristic of the waveguide.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.