Laser line probe having improved high dynamic range
US9267784B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 11, 2014 |
| Grant date | Feb 23, 2016 |
| Priority date | — |
| Expiry date | Aug 13, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/589
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for measuring three-dimensional coordinates of an object surface with a line scanner, the line scanner including a projector and a camera, the projector projecting onto the object surface a first line of light at a first time and a second line of light at a second time, the integrated energy of the second line of light different than the first line of light, the camera capturing the reflections of the first line of light and the second line of light, a processor processing the collected data after discarding portions of the image that are saturated or dominated by electrical noise, and determining three-dimensional coordinates of the object surface based at least in part on the processed data and on a baseline distance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.