System and method for making concentration measurements within a sample material using orbital angular momentum
US9267877B2 · kind B2 · utility
16Cited by
22References
30Claims
0Family size
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Key dates
| Filing date | Jul 24, 2014 |
| Grant date | Feb 23, 2016 |
| Priority date | — |
| Expiry date | Jul 24, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/21
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Signal generation circuitry generates a first signal having at least one orbital angular momentum applied thereto and applies the first signal to the sample. A detector for receives the first signal after it passes through the sample and determines the concentration of the material within the sample based on a detected value of orbital angular momentum with the first signal received from the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.