Removal of ions from survey scans using variable window band-pass filtering to improve intrascan dynamic range
US9269555B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 30, 2012 |
| Grant date | Feb 23, 2016 |
| Priority date | — |
| Expiry date | May 30, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/429
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Systems and methods are used to band-pass filter ions from a mass range. A full spectrum is received for a full scan of a mass range using a tandem mass spectrometer. A mass selection window of the full spectrum is selected and a set of tuning parameter values is selected. The tandem mass spectrometer is instructed to perform a scan of the mass selection window using the set of tuning parameter values. A spectrum is received for the scan from the tandem mass spectrometer. A band-pass filtered spectrum is created for the mass range that includes values from the spectrum for the mass selection window of the mass range. Systems and methods are also used to band-pass filter ions from two or more mass selection windows across the mass range and to filter out ions from a mass selection window between two band-pass mass selection windows.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.